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IEC Standard Articulated Test Probe is a precision test probe made according to Figure 2 (Fig. 2) of the IEC 61032 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL. IEC 60335, IRAM 4220-1 and in most of the rules involved in the verification of accessibility to live parts.
The Jointed Test Finger was made on stainless steel and Polyamide handle.
Material: Stainless Steel.
Finish: Chrome plating.
According to: IEC 61032, IEC 60335-1, IEC 60529-2001, IRAM 4220-1, SASO/IEC 60335-1, SASO IEC 60950, IEC 60950/EN60950.
HK LEE HING INDUSTRY CO., LIMITED are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.
Main Products: Go Not Go Gauges, IP Tester, Test Probe Kit, Impact Test Equipment, Test Probes, Spring Hammer, IEC 61032 Test Finger, AC Hipot Tester, IEC Test Probe, UL Test Probe, Material Flammability Tester, IP Code Tester, Impact Test Apparatus, Security Testing Machine, Plugs and Socket Outlet Gauge, Lamp Cap Gauge Tester, Lampholders Gauge Tester, Plug & Socket Tester, Electrical Safety Tester, LED Test Instruments, Environmental Test Equipment, Instrument Accessories, Weighing Sensor and More.
If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.
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Contacts: Nina She
Address: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China
Contact: Nina She
Add: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China