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The Jointed Test Finger is a precision test probe made according to IEC 60238 Figure 16 and IEC 61032 Figure 2 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL and in most of the rules involved in the verification of accessibility to live parts.
1. Knurled Finger Diameter: 12 mm
2. Knurled Finger Length: 80 mm
3. Baffle Plate Diameter: 50 mm
4. Baffle Plate Length: 100 mm
5. Baffle thickness: 20 mm
HK LEE HING INDUSTRY CO., LIMITED are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.
Main Products: Go No Go Gauges, IP Tester, Test Probe Kit, Impact Test Equipment, Test Probes, Spring Hammer, IEC 61032 Test Finger, AC Hipot Tester, IEC Test Probe, UL Test Probe, Material Flammability Tester, IP Code Tester, Impact Test Apparatus, Security Testing Machine, Plugs and Socket Outlet Gauge, Lamp Cap Gauge Tester, Lampholders Gauge Tester, Plug & Socket Tester, Electrical Safety Tester, LED Test Instruments, Environmental Test Equipment, Instrument Accessories, Weighing Sensor and More.
If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.
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Contacts: Nina She
Address: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China
Contact: Nina She
Add: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China